Augment Your Metrology Systems with Defect‑Aware Intelligence
Spectron’s modular AI and synthetic‑data pipeline can be injected directly into coordinate measuring machines (CMMs), laser scanners, and optical profilers turning every precision device into a dual‑purpose powerhouse for both measurement and visual quality inspection.
Overview
Dual‑Mode Operation: Combine dimensional accuracy with real‑time surface defect detection.
Seamless Integration: Plug our AI modules into your current metrology software and workflows.
Synthetic Data Boost: Generate thousands of labeled defect scenarios from your minimal sample scans.
Local Inference & HITL: Run on‑premise AI with human‑in‑the‑loop feedback for continuous model refinement.
Unlock new defect‑detection capabilities in your existing metrology systems
AI Module Injection
Embed Spectron’s vision models alongside your measurement algorithms.
Flag scratches, dents, pits, and cracks as part of your standard inspection routine.
Synthetic Data Curation
Automatically generate extensive datasets with pixel‑perfect masks and metadata.
Ensure robust model performance across rare or new defect types.
Synthetic DataSecure, On‑Premise Deployment
Keep your data in‑house—no forced cloud upload.
Low-latency inference to maintain high throughput.
Why Metrology Providers Choose Spectron
Extend Revenue Streams: Offer value‑add defect detection without new hardware.
Differentiate Your Portfolio: Stand out with integrated AI analytics and reports.
Accelerate Customer ROI: Clients see quality improvements and reduced scrap rates from day one.
